TY - CONF A1 - Radtke, Martin A1 - Buzanich, Günter A1 - Fittschen, U.E.A A1 - Menzel, M. A1 - Scharf, Oliver A1 - Horntrich, C. A1 - Montoya, V. A1 - McIntosh, K. A1 - Havrilla, G.J. T1 - Evaluation of total reflection X-ray fluorescence (TXRF) analysis using a color X-ray camera (CXC) T2 - 15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013) T2 - 15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013) CY - Osaka, Japan DA - 2013-09-23 PY - 2013 AN - OPUS4-29859 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -