TY - GEN A1 - Kjaervik, Marit T1 - Quantitative biocide profile measurements by calibrated XPS N2 - This presentation provides an update on recent results from quantitative XPS-measurements of real and artificial biofilms. NAP-XPS, lab-based XPS and synchrotron-based XPS was used to obtain a vertical concentration profile of iodine in agarose-films with information depth ranging from 1 to 18 nm. T2 - Project meeting MetVBadBugs CY - Turin, Italy DA - 05.02.2019 KW - Biofilms KW - NAP-XPS KW - XPS KW - Iodine KW - Agarose PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/47332 AN - OPUS4-47332 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany