TY - JOUR A1 - Heyde, M. A1 - Sturm, Heinz A1 - Rademann, K. T1 - New application for the calibration of scanning probe microscopy piezos JF - Surface and interface analysis KW - Scanning probe microscope KW - Piezoelectric translator KW - Calibration KW - Height Calibration KW - Force-Microscopy PY - 1999 SN - 0142-2421 SN - 1096-9918 VL - 27 IS - 5-6 SP - 291 EP - 295 PB - Wiley CY - Chichester AN - OPUS4-6858 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -