TY - CONF A1 - Mielke, Johannes A1 - Rades, Steffi A1 - Ortel, Erik A1 - Wirth, Thomas A1 - Salge, T. A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Advanced analytical scanning electron microscopy for the characterization of nanoparticles T2 - EuoNanoForum 2015 T2 - EuoNanoForum 2015 CY - Riga, Lativa DA - 2015-06-10 PY - 2015 AN - OPUS4-33402 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -