TY - JOUR A1 - Ressel, P. A1 - Österle, Werner A1 - Urban, Ingrid A1 - Dörfel, Ilona A1 - Klein, A. A1 - Vogel, K. A1 - Kräutle, H. T1 - Transmission electron microscopy study of rapid thermally annealed Pd/Ge contacts on IN0.53Ga0.47As JF - Journal of applied physics PY - 1996 SN - 0021-8979 SN - 1089-7550 VL - 88 SP - 3910 EP - 3914 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-2514 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -