TY - GEN A1 - Stegemann, Bert A1 - Backhaus, Henrik A1 - Kloß, Heinz A1 - Santner, Erich A2 - Méndez-Vilas, A. A2 - J. Diaz, T1 - Spherical AFM Probes for Adhesion Force Measurements on Metal Single Crystals T2 - Modern Research and Educational Topics in Microscopy - FORMATEX Microscopy series No. 3 CY - Badajoz, Spain KW - Atomic force microscopy KW - Force distance curves KW - Adhesion force KW - Ultrahigh vacuum KW - Silver KW - Copper KW - Antimony PY - 2007 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/17400 AN - OPUS4-17400 SN - 978-84-611-9420-9 VL - 2 SP - 820 EP - 827 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany