TY - CONF A1 - Kreutzbruck, Marc A1 - Brekow, Gerhard A1 - Böhm, R. A1 - Montag, Hans-Joachim A1 - Allweins, K. A1 - Strackbein, C. A1 - Bernau, H. T1 - Visualization of material defects - modern approaches in acoustical and electrical NDE-methods T2 - ICAMT 2008 - International Conference on Advances in Manufacturing Technology for Young Engineers N2 - Increasing demands in materials quality and cost effectiveness have led to advanced standards in manufacturing technology. Especially when dealing with high quality standards in conjunction with high throughput quantitative NDE techniques are vital to provide reliable and fast quality control systems. Fast NDE-systems using a high degree of automatisation can be used for both determining the degree of integrity of the components under test and indicating a change of production parameters as well. However, independently of the applied NDE method and the underlying physical principle a reliable visualisation of hidden defects within the component under test is based on a sufficient high signal to noise ratio (SNR) and a high spatial resolution. In this talk we illuminate two standard NDT methods such as Ultrasonic Testing and Eddy Current Testing and show their physical principles also discussing the interaction between sound waves or induced eddy currents with different kinds of material defects. This introduction substantiates the attainable SNR and spatial resolution of both methods with respect to defect sizing and defect classification. As a first future prospect we report on the SAFT-algorithm to improve SNR and spatial resolution paving the way for a flaw sizing approach in ultrasonic inspection. As a second modern NDE approach we represent the use of small magnetoresistance sensor arrays for EC testing of Al-laser welds or for testing superconducting wires. The high sensitivity and small extent of GMR sensors results in a remarkably SNR and spatial resolution offering new visualisation techniques for defect localisation, defect characterization and tomography-like mapping techniques. T2 - ICAMT 2008 - International Conference on Advances in Manufacturing Technology for Young Engineers CY - Madras, Chennai, India DA - 2008-02-06 PY - 2008 IS - CD-ROM (A.4 / I-1) SP - 1 PB - Indian National Academy of Engineering (INAE) CY - Madras, Chennai, India AN - OPUS4-17622 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -