TY - CONF A1 - Krüger, Hannes A1 - Kemnitz, E. A1 - Hertwig, Andreas A1 - Beck, Uwe T1 - Ellipsometric Studies of Sol-Gel MgF2 and TiO2 Layer Stacks for Optical Applications T2 - 5th Workshop Ellipsometry T2 - 5th Workshop Ellipsometry CY - Zweibrücken, Germany DA - 2009-03-02 PY - 2009 AN - OPUS4-18478 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -