TY - CONF A1 - Bruno, Giovanni A1 - Laquai, René A1 - Wieder, Frank A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Serrano Munoz, Itziar T1 - The combined use of X-ray refraction and trans-mission radiography and computed tomography N2 - Alternative to conventional transmission-based radiography and computed tomography, X-ray refraction techniques are being increasingly used to detect damage in light materials. In fact, their range of application has been recently extended even to metals. The big advantage of X-ray refraction techniques is that they are able to detect nanometric defects, whose size would lie below the resolution of even state-of-the-art synchrotron-based X-ray computed tomography (SXCT). The superiority of synchrotron X-ray refraction radiography and tomography (SXRR and SXRCT) has been shown in the case of light materials, in particular composites. X-ray refraction techniques also yield a quantitifaction of the amount of damage (the so-called relative internal specific surface) and can well be compared with damage models. At the same time, it is impossible for SXRR and SXRCT to image single defects. We show that the combination of refraction- and transmission-based imaging techniques yields an impressive amount of additional information about the type and amount of defects in microstructured materials such as additively manufactured metals or metal matrix composites. We also show that the use of data fusion techniques allows the classification of defects in statistically significant representative volume elements. T2 - 11th Conference on Industrial Computed Tomography CY - Online meeting DA - 08.02.2022 KW - X-ray refraction radiography KW - Computed Tomography KW - Synchrotron radiation KW - Additive manufacturing KW - Damage evolution PY - 2022 AN - OPUS4-54327 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -