TY - CONF A1 - Bruno, Giovanni A1 - Ehrig, Karsten A1 - Haarring, Holger A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Meinel, Dietmar T1 - Industrial and Synchrotron X-ray CT applications for materials characterization T2 - Conference on Industrial Computed Tomography T2 - Conference on Industrial Computed Tomography CY - Wels, Austria DA - 2014-02-25 PY - 2014 AN - OPUS4-30506 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -