TY - CONF A1 - Gollwitzer, Christian A1 - Bellon, Carsten A1 - Deresch, Andreas A1 - Ewert, Uwe A1 - Jaenisch, Gerd-Rüdiger A1 - Zscherpel, Uwe A1 - Mistral, Q. ED - Thompson, D. O. ED - Chimenti, D. E. T1 - Simulation supported POD for RT test case - concept and modeling T2 - Review of progress in quantitative nondestructive evaluation, volume 31 N2 - Within the framework of the European project PICASSO, the radiographic simulator aRTist (analytical Radiographic Testing inspection simulation tool) developed by BAM has been extended for reliability assessment of film and digital radiography. NDT of safety relevant components of aerospace industry requires the proof of probability of detection (POD) of the inspection. Modeling tools can reduce the expense of such extended, time consuming NDT trials, if the result of simulation fits to the experiment. Our analytic simulation tool consists of three modules for the description of the radiation source, the interaction of radiation with test pieces and flaws, and the detection process with special focus on film and digital industrial radiography. It features high processing speed with near–interactive frame rates and a high level of realism. A concept has been developed as well as a software extension for reliability investigations, completed by a user interface for planning automatic simulations with varying parameters and defects. Furthermore, an automatic image analysis procedure is included to evaluate the defect visibility. The radiographic modeling from 3D CAD of aero engine components and quality test samples are compared as a precondition for real trials. This enables the evaluation and optimization of film replacement for application of modern digital equipment for economical NDT and defined POD. T2 - 38th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Burlington, VT, USA DA - 2011-07-17 KW - X-ray imaging KW - Probability of detection KW - Simulation KW - ZfP KW - Radiographie KW - POD PY - 2012 SN - 978-0-7354-1013-8 DO - https://doi.org/10.1063/1.4716283 SN - 0743-0760 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings VL - 31 IS - 1430 SP - 605 EP - 612 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-26696 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -