TY - JOUR A1 - Strub, Erik A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Reznikova, E. T1 - Measurements with compound refractive lenses at the "BAMline" JF - Nuclear instruments and methods in physics research B N2 - A set of compound refractive lenses (CRLs), mounted on a silicon wafer, was obtained from the Institut für Mikrostrukturtechnik Karlsruhe. The CRLs were characterized at the BAMline at the synchrotron BESSYII in Berlin. It could be demonstrated that beam diameters below 1 µm can be obtained. The beam size accepted by the lenses is (140 × 140) µm2, thus the intensity gain in the micrometer spot, including absorption, is about 15,000. It is possible to switch between different beam energies within a few minutes. First results of scans and the application of the lenses for MicroXANES (X-ray absorption near-edge structure) measurements are presented in this paper. Also, the possibility of MicroEXAFS (extended X-ray absorption fine structure) measurements is discussed. KW - X-ray optics KW - XANES KW - EXAFS KW - XAS KW - XRF KW - Speciation PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.02.057 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2165 EP - 2168 PB - Elsevier CY - Amsterdam AN - OPUS4-17554 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -