TY - JOUR A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg A1 - Ekenhorst, Derk A1 - Judd, M.D. A1 - Raynal, R. T1 - X-ray refraction characterizes leight weight materials JF - Preparing for the future PY - 1998 SN - 1018-8657 VL - 8 IS - 3 SP - 14 EP - 15 PB - European Space Agency CY - Noordwijk AN - OPUS4-3331 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -