TY - CONF A1 - Nooke, Alida A1 - Krüger, Hannes A1 - Hertwig, Andreas A1 - Krause, Andreas A1 - Beck, Uwe A1 - Lohse, Volkmar T1 - Surface Plasmon Enhanced Total Internat Reflection Ellipsometry for Detection and Monitoring of Hazardous Gases T2 - International Conference on Spectroscopic Ellipsometry (ICSE V) T2 - International Conference on Spectroscopic Ellipsometry (ICSE V) CY - Albany, NY, USA DA - 2010-05-23 PY - 2010 AN - OPUS4-20040 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -