TY - CONF A1 - Radtke, Martin A1 - Reiche, I. A1 - Berger, Achim A1 - Merchel, Silke A1 - Riesemeier, Heinrich A1 - Görner, Wolf A1 - Riederer, J. A1 - Roth, M. ED - Simionovici, A. T1 - BAMline meets Dürer and Van Eyck - Spatially resolved SR-XRF analyses of silver point drawings and their mysterious inscriptions T2 - 17th International Conference on X-Ray Optics and Microanalysis T2 - 17th International Conference on X-Ray Optics and Microanalysis ; 17th ICXOM CY - Chamonix, France DA - 2003-09-22 PY - 2003 N1 - Serientitel: Spectrochimica acta : Part B, Atomic spectroscopy – Series title: Spectrochimica acta : Part B, Atomic spectroscopy IS - 59.2004,10/11 SP - 48 PB - Elsevier CY - Amsterdam AN - OPUS4-2690 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -