TY - JOUR A1 - Danilewsky, A.N. A1 - Rack, A. A1 - Wittge, J. A1 - Weitkamp, T. A1 - Simon, R. A1 - Riesemeier, Heinrich A1 - Baumbach, T. T1 - White beam synchrotron topography using a high resolution digital X-ray imaging detector JF - Nuclear instruments and methods in physics research B N2 - X-ray topography is a well known imaging technique to characterise strain and extended defects in single crystals. Topographs are typically collected on X-ray films. On the one hand such photographic films show a limited dynamic range and the production of films will be discontinued step by step in the near future. On the other hand new imaging detectors improved for X-ray tomography become more and more attractive even for topography because of increasing resolution, dynamic range, speed and active area. In this paper we report about the upgrade of the TOPO–TOMO beamline at the synchrotron light source ANKA, Research Centre Karlsruhe, with a high resolution digital camera for the topography use. KW - White beam topography KW - Synchrotron radiation KW - Digital X-ray detector KW - Scintillator KW - Synchrotron instrumentation KW - Digital radiography PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.02.065 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 9 SP - 2035 EP - 2040 PB - Elsevier CY - Amsterdam AN - OPUS4-18567 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -