TY - JOUR A1 - Schick, D. A1 - Herzog, M. A1 - Bojahr, A. A1 - Leitenberger, W. A1 - Hertwig, Andreas A1 - Shayduk, R. A1 - Bargheer, M. T1 - Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction JF - Structural dynamics N2 - Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates. KW - Festkörperphysik KW - Dünnschichttechnik KW - Ellipsometrie KW - Röntgenbeugung KW - Optische Konstanten PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-322471 DO - https://doi.org/10.1063/1.4901228 SN - 2329-7778 VL - 1 IS - 6 SP - 064501-1 - 064501-13 PB - AIP Publishing LLC CY - Melville, NY AN - OPUS4-32247 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -