TY - JOUR A1 - Ahmadi, Samim A1 - Burgholzer, P. A1 - Jung, P. A1 - Caire, G. A1 - Ziegler, Mathias T1 - Super resolution laser line scanning thermography JF - Optics and Lasers in Engineering N2 - In this paper we propose super resolution measurement and post-processing strategies that can be applied in thermography using laser line scanning. The implementation of these techniques facilitates the separation of two closely spaced defects and avoids the expected deterioration of spatial resolution due to heat diffusion. The experimental studies were performed using a high-power laser as heat source in combination with pulsed thermography measurements (step scanning) or with continuous heating measurements (continuous scanning). Our work shows that laser line step scanning as well as continuous scanning both can be used within our developed super resolution (SR) techniques. Our SR techniques make use of a compressed sensing based algorithm in post- processing, the so-called iterative joint sparsity (IJOSP) approach. The IJOSP method benefits from both - the sparse nature of defects in space as well as from the similarity of each measurement. In addition, we show further methods to improve the reconstruction quality e.g. by simple manipulations in thermal image processing such as by considering the effect of the scanning motion or by using different optimization algorithms within the IJOSP approach. These super resolution image processing methods are discussed so that the advantages and disadvantages of each method can be extracted. Our contribution thus provides new approaches for the implementation of super resolution techniques in laser line scanning thermography and informs about which experimental and post-processing parameters should be chosen to better separate two closely spaced defects. KW - Super resolution KW - Laser thermography KW - Compressed sensing KW - Laser scanning KW - Joint sparsity PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509796 DO - https://doi.org/10.1016/j.optlaseng.2020.106279 SN - 0143-8166 VL - 134 SP - 106279 PB - Elsevier Ltd. AN - OPUS4-50979 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -