TY - CONF A1 - Witt, Jens T1 - Production method for analog ISO/IEC-tests charst according to ISO/IEC 15775 T2 - BAM-DIN-Workshop on Image Technology T2 - BAM-DIN-Workshop on Image Technology CY - Berlin, Germany DA - 2005-04-19 PY - 2005 AN - OPUS4-11406 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -