TY - JOUR A1 - Trimpin, S. A1 - Inutan, E. A1 - Karki, S. A1 - Elia, E. A1 - Zhang, W. A1 - Weidner, Steffen A1 - Marshall, D. A1 - Hoang, K. A1 - Lee, C. A1 - Davis, E. A1 - Smith, V. A1 - Meher, A. A1 - Cornejo, M. A1 - Auner, G. A1 - McEwen, C. T1 - Fundamental studies of new ionization technologies and insights from IMS-MS T2 - Journal of the American Society for Mass Spectrometry (JASMS) N2 - Exceptional ion mobility spectrometry mass spectrometry (IMS-MS) developments by von Helden, Jarrold, and Clemmer provided technology that gives a view of chemical/biological compositions previously not achievable. The ionization method of choice used with IMS-MS has been electrospray ionization (ESI). In this Special issue contribution, we focus on fundamentals of heretofore unprecedented means for transferring volatile and nonvolatile compounds into gas-phase ions singly and multiply charged. These newer ionization processes frequently lead to different selectivity relative to ESI and, together with IMS-MS, may provide a more comprehensive view of chemical compositions directly from their original Environment such as surfaces, e.g., tissue. Similarities of results using solvent- and matrix-assisted ionization are highlighted, as are differences between ESI and the inlet ionization methods, especially with mixtures such as bacterial extracts. Selectivity using different matrices is discussed, as are results which add to our fundamental knowledge of inlet ionization as well as pose additional avenues for inquiry. IMS-MS provides an opportunity for comparison studies relative to ESI and will prove valuable using the new ionization technologies for direct analyses. Our hypothesis is that some ESI-IMS-MS applications will be replaced by the new ionization processes and by understanding mechanistic aspects to aid enhanced source and method developments this will be hastened. PB - Springer KW - Inlet ionization KW - Vacuum ionization KW - Matrices KW - Fundamentals KW - Ion mobility PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/48011 AN - OPUS4-48011 SN - 1044-0305 SN - 1879-1123 VL - 30 IS - 6 SP - 1133 EP - 1147 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany