TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Scanning Probe Microscopy Techniques to characterise electric and dielectric properties of nanometer sized particles T2 - ECOF 7, European Conference Thin Organised Films T2 - ECOF 7, European Conference Thin Organised Films CY - Potsdam, Germany DA - 1998-09-18 PY - 1998 AN - OPUS4-6464 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -