TY - CONF A1 - Sturm, Heinz A1 - Geuss, Markus T1 - Methods for Simultaneous Measurements of Topography and Local Electrical Properties: Conductivity, Capacity, Surface Charge and Inverse Piezoelectricity T2 - Workshop: Rastersondenmikroskopie in Forschung und Industrie an der GH Wuppertal T2 - Workshop: Rastersondenmikroskopie in Forschung und Industrie an der GH Wuppertal CY - Wuppertal, Germany DA - 1999-03-11 PY - 1999 AN - OPUS4-6496 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -