TY - CONF A1 - Sturm, Heinz T1 - Scanning Force Microscopy (SFM) with additional mechanical and electrical materials contrasts T2 - Seminar of the Department of Materials and Interfaces, Weizmann Institute of Science T2 - Seminar of the Department of Materials and Interfaces, Weizmann Institute of Science CY - Rehovot, Israel DA - 1997-02-16 PY - 1997 AN - OPUS4-6412 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -