TY - CONF A1 - Sturm, Heinz T1 - Harmonically modulated friction force microscopy: An AFM tool for analysis and modification of polymer surfaces T2 - International Symposium on Polymer Surface Characterization (MST conference) T2 - International Symposium on Polymer Surface Characterization (MST conference) CY - Newark, NJ, USA DA - 2000-10-10 PY - 2000 AN - OPUS4-6505 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -