TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz ED - Bhushan, B. T1 - Nanomechanical Characterization of Structural and Pressure-Sensitive Adhesives T2 - Applied scanning probe methods / 7: Biomimetics and industrial applications (NanoScience and technology) KW - Scanning Force Microscopy KW - Modulated Lateral Force Microscopy KW - Stiffness KW - Friction KW - Interface/Interphase Interdiffusion PY - 2007 SN - 3-540-37320-9 DO - https://doi.org/10.1007/978-3-540-37321-6_8 VL - 7 SP - 301 EP - 347 PB - Springer CY - Berlin AN - OPUS4-14974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -