TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Schulz, Eckhard T1 - Methods for simultaneous measurements of topography and local electrical properties using scanning force microscopy T2 - 9th International Symposium on Electrets (ISE9) T2 - 9th International Symposium on Electrets (ISE9) CY - Shanghai, China DA - 1996-09-15 PY - 1996 AN - OPUS4-6396 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -