TY - GEN A1 - Spranger, Holger T1 - THz-ToF techniques for the detection of inherent discontinuities in dielectric materials based on a SAFT – and an Optical Layer reconstruction algorithm N2 - Electromagnetic waves with frequencies between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials makes T-rays attractive to reveal discontinuities in polymer and ceramic materials. THz-Time Domain Spectroscopy Systems (THz-TDS) are available on the market today which operates with THz-pulses transmitted and received by optically pumped semiconductor antennas. In THz-TDS the travelling time (ToF) and shape of the pulse is changed if it interacts with the dielectric material and its inherent disconti-nuities. A tomogram of the object under the test can be reconstructed from time of flight diffraction (ToFD) scans if a synthetic focusing aperture (SAFT) algorithm is applied. Otherwise, planar discontinuities like cracks in plastics or delaminated lay-ers in composites can be abstracted as layers located at any angle in relation to the outer sample surface direction. A tomogram from the scanned sample can then be reconstructed in case the interactions of electromagnetic pulses with the existing in-herent interfaces are detectable and a model is assumed which describes the device under the test as multilayer structure composed of thin layers with different dielec-tric properties. A short description of both the SAFT – and Optical Layer algorithm for the recon-struction of the inherent structure is initially given. Measurements on representative samples with a variety of artificially produced small and large scale. Reconstructed tomograms are presented to discuss and evaluate the benefits and limits of the two different reconstruction approaches. T2 - 19th World Conference on Non-Destructive Testing 2016 CY - Munich, Germany DA - 13.06.2016 KW - SAFT KW - ToF KW - Optical layer reconstruction KW - Dielectric materials KW - THz PY - 2016 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/36591 AN - OPUS4-36591 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany