TY - CONF A1 - Beckmann, Jörg A1 - Spranger, Holger A1 - Ewert, Uwe T1 - THz Applications for Non-Destructive Testing T2 - 2017 Far East NDT New Technology & Application Forum (FENDT) N2 - Up to now THz-TDS-systems aren’t considered to be nondestructive testing facilities for large scale industrial applications, despite it was proven that they provide a comprehensive set of quality parameters. A practical approach to bring THz-TDS in addition to already existing testing systems into the industrial mainstream is systematic development of future test procedures and test facilities for dielectrics. For this purpose polyeth-ylene test specimen with introduced artefacts were designed, to evaluate the detection sensitivity of Time of Flight measurements based on dielectrics. SAFT reconstructed tomograms are presented which visualize the sizes and location of artificially introduced flaws. PB - IEEE Conference Publication CY - USA T2 - 2017 Far East NDT New Technology & Application Forum (FENDT) CY - XI'an, China DA - 22.06.2017 KW - THz radiation KW - Dielectric materials KW - Image reconstruction KW - Terahertz synthetic aperture PY - 2018 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/47220 AN - OPUS4-47220 VL - 12 SP - 272 EP - 276 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany