TY - JOUR A1 - Meine, Kerstin A1 - Kloß, K. A1 - Schneider, Thomas A1 - Spaltmann, Dirk T1 - The influence of surface roughness on the adhesion force JF - Surface and interface analysis N2 - Adhesion measurements are presented which were carried out with an atomic force microscope between polymer balls attached to a cantilever and a silicon wafer under ultra high vacuum conditions. In using a silicon surface with a defined structure a correlation between adhesion force and contact area was found. This correlation could partly be explained by the Johnson-Kendall-Roberts model, if a change of the surface energy is assumed as a result of the structuring. For a constant geometric contact area an additional structuring leads to a decrease of the adhesion force. T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin DA - 2003-10-05 KW - Roughness KW - Adhesion KW - AFM KW - UHV KW - JKR model KW - Surface energy PY - 2004 DO - https://doi.org/10.1002/sia.1738 SN - 0142-2421 SN - 1096-9918 VL - 36 IS - 8 SP - 694 EP - 697 PB - Wiley CY - Chichester AN - OPUS4-4708 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -