TY - JOUR A1 - Pauw, Brian Richard A1 - Smith, A. J. A1 - Snow, T. A1 - Terril, N. J. A1 - Thünemann, Andreas T1 - The modular small-angle X-ray scattering data correction sequence T2 - Journal of Applied Crystallography N2 - Data correction is probably the least favourite activity amongst users experimenting with small-angle X-ray scattering: if it is not done sufficiently well, this may become evident only during the data analysis stage, necessitating the repetition of the data corrections from scratch. A recommended comprehensive sequence of elementary data correction steps is presented here to alleviate the difficulties associated with data correction, both in the laboratory and at the synchrotron. When applied in the proposed order to the raw signals, the resulting absolute scattering cross section will provide a high degree of accuracy for a very wide range of samples, with its values accompanied by uncertainty estimates. The method can be applied without modification to any pinhole-collimated instruments with photon-counting direct-detection area detectors. PB - International Union of Crystallography KW - Small-angle X-ray scattering KW - SAXS KW - Accuracy KW - Methodology KW - Data correction PY - 2017 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/43211 AN - OPUS4-43211 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-432114 SN - 1600-5767 VL - 50 IS - 6 SP - 1800 EP - 1811 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany