TY - CONF A1 - Seeger, Stefan T1 - Characterization of Localized NP Emission Sources - Examples T2 - Metrology of Airborne Nanoparticles, Standardisation and Applications (MANSA-Workshop), NPL T2 - Metrology of Airborne Nanoparticles, Standardisation and Applications (MANSA-Workshop), NPL CY - London, England DA - 2010-06-08 PY - 2010 AN - OPUS4-21434 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -