TY - CONF A1 - Schmidt, Wolfram A1 - Radebe, N. A2 - Schmidt, Wolfram T1 - Biased by analytical equipment T2 - ISEE Africa - Innovation, Science, Engineering, Education N2 - Today, in scientific events often a certain separation between researchers from laboratories with highly sophisticated equipment and those from less privileged laboratories can be observed. It is not an uncommon situation that results presented at conferences are rubbished or ridiculed because the investigator only used low-end analytical methods. The assessment of the study is then biased based on the equipment, regardless of the actual quality of the study. PB - Bundesanstalt für Materialforschung und -prüfung (BAM) CY - Berlin T2 - ISEE Africa - Innovation, Science, Engineering, Education CY - Nairobi, Kenya DA - 30.01.2019 KW - Analytics KW - Africa KW - Bias KW - Science KW - Research PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/48487 AN - OPUS4-48487 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-484877 UR - http://isee-africa.com/wp-content/uploads/2019/07/Innovation-Science-Engineering-Education_High-Quality.pdf SN - 978-3-9818564-2-2 SP - 203 EP - 204 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany