TY - JOUR A1 - Schäfer, N. A1 - Chahine, G. A. A1 - Wilkinson, A. J. A1 - Schmid, Thomas A1 - Rissom, T. A1 - Schülli, T. U. A1 - Abou-Ras, D. T1 - Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction JF - Journal of Applied Crystallography N2 - Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10^-4. These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy. KW - Microstrain distribution KW - X-ray microdiffraction KW - Polycrystalline thin films KW - Raman microscopy PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-366592 DO - https://doi.org/10.1107/S1600576716003204 SN - 1600-5767 VL - 49 SP - 632 EP - 635 AN - OPUS4-36659 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -