TY - CONF A1 - Ritter, Martin A1 - Kranzmann, Axel T1 - Analysis of multimodal 3D microscopy measurements T2 - EMC T2 - EMC CY - Aachen, Germany DA - 2008-09-01 PY - 2008 AN - OPUS4-18437 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -