TY - JOUR A1 - Rackwitz, Vanessa A1 - Procop, M. A1 - Hodoroaba, Vasile-Dan T1 - Characterization of polycapillary X-ray semilenses with SEM/EDX T2 - Microscopy and microanalysis PB - Cambridge University Press CY - New York, NY KW - Polycapillary X-ray optics KW - Semi-lens KW - Parallelising mode KW - SEM KW - EDS KW - Acceptance area KW - FWHM KW - Transmission KW - Focal distance KW - XRF PY - 2010 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/27219 AN - OPUS4-27219 SN - 1431-9276 SN - 1435-8115 VL - 16 IS - Suppl 2 SP - 932 EP - 933 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany