TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa T1 - Prediction of detection limits of micro X-ray fluorescence (muXRF) T2 - Microscopy and microanalysis PB - Cambridge University Press CY - New York, NY KW - X-ray scattering KW - Limits of detection KW - Peak-to-background KW - Peak-to-noise KW - XRF KW - Modelling PY - 2012 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/26754 AN - OPUS4-26754 SN - 1431-9276 SN - 1435-8115 VL - 18 IS - Suppl. 2 SP - 942 EP - 943 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany