TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa A1 - Reuter, Dirk T1 - X-ray scattering and its benefits for X-ray spectrometry at the SEM JF - Microscopy and microanalysis PY - 2009 DO - https://doi.org/10.1017/S1431927609094392 SN - 1431-9276 SN - 1435-8115 VL - 15 IS - Suppl. 2 SP - 1122 EP - 1123 PB - Cambridge University Press CY - New York, NY AN - OPUS4-19792 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -