TY - CONF A1 - Pignatelli, Giuseppe A1 - Strasse, Anne A1 - Gornushkin, Igor B. A1 - Altenburg, Simon A1 - Scheuschner, Nils T1 - Optical emission spectroscopy as monitoring tool for ded N2 - This presentstion explains how optical emission spectroscopy can be exploited to on line monitor a DED printing production. This technique is tested printing on a substrate with artificial defects. T2 - 1st Workshop on In-situ Monitoring and Microstructure Development in Additive Manufacturing CY - Online meeting DA - 10.12.2020 KW - Monitoring KW - Spectroscopy KW - Analytical chemistry KW - Additive manufacturing PY - 2020 AN - OPUS4-51877 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -