TY - CONF A1 - Oran, Umut A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Unveren, E. T1 - A comparison study between Time-of-Flight Static Secondary lon Mass Spectrometry (TOF-SSIMS) and X-Ray Photoelectron Spectroscopy (XPS) in terms of Poly-dimethyl-siloxane (PDMS) contemination of Polystyrene (PS) samples T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -