TY - JOUR A1 - Höhse, Marek A1 - Mory, D. A1 - Florek, S. A1 - Weritz, Friederike A1 - Gornushkin, Igor B. A1 - Panne, Ulrich T1 - A combined laser-induced breakdown and Raman spectroscopy Echelle system for elemental and molecular microanalysis T2 - Spectrochimica acta B N2 - Raman and laser-induced breakdown spectroscopy is integrated into a single system for molecular and elemental microanalyses. Both analyses are performed on the same ~ 0.002 mm² sample spot allowing the assessment of sample heterogeneity on a micrometric scale through mapping and scanning. The core of the spectrometer system is a novel high resolution dual arm Echelle spectrograph utilized for both techniques. In contrast to scanning Raman spectroscopy systems, the Echelle-Raman spectrograph provides a high resolution spectrum in a broad spectral range of 200-6000 cm- 1 without moving the dispersive element. The system displays comparable or better sensitivity and spectral resolution in comparison to a state-of-the-art scanning Raman microscope and allows short analysis times for both Raman and laser induced breakdown spectroscopy. The laser-induced breakdown spectroscopy performance of the system is characterized by ppm detection limits, high spectral resolving power (15,000), and broad spectral range (290-945 nm). The capability of the system is demonstrated with the mapping of heterogeneous mineral samples and layer by layer analysis of pigments revealing the advantages of combining the techniques in a single unified set-up. PB - Elsevier CY - Amsterdam KW - LIBS KW - Raman KW - Echelle KW - Laser-induced breakdown spectroscopy KW - Hyphenated technique PY - 2009 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/20493 AN - OPUS4-20493 SN - 0584-8547 SN - 0038-6987 VL - 64 IS - 11-12 SP - 1219 EP - 1227 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany