TY - JOUR A1 - Mielke, Johannes A1 - Rades, Steffi A1 - Ortel, Erik A1 - Salge, T. A1 - Hodoroaba, Vasile-Dan T1 - Improved spatial resolution of EDX/SEM for the elemental analysis of nanoparticles JF - Microscopy and microanalysis N2 - The interest in nanoparticles remains at a high level in fundamental research since many years and increasingly, nanoparticles are incorporated into consumer products to enhance their performance. Consequently, the accurate and rapid characterization of nanoparticles is more and more demanded. Electron microscopy (SEM, TSEM and TEM) is one of the few techniques which are able to image individual nanoparticles. It was demonstrated recently that the transmission electron microscopy at a SEM can successfully be applied as a standard method to characterize accurately the size (distribution) and shape of nanoparticles down to less than 10 nm. PY - 2015 DO - https://doi.org/10.1017/S1431927615009344 SN - 1431-9276 SN - 1435-8115 VL - 21 IS - Suppl. 3 SP - Paper 0855, 1713 EP - 1714 PB - Cambridge University Press CY - New York, NY AN - OPUS4-34923 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -