TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Grothausmann, R. A1 - Manke, I. T1 - Application of the DIRECTT algorithm to sub-nanometer electron tomography T2 - DIR 2011 - International symposium on digital industrial raidology and computed tomography (Proceedings) N2 - Tomography data obtained from transmission electron microscopes are especially attractive due to their unrivaled spatial resolution in the nanometer range or even less, but they require enormous efforts in sample preparation and suffer from a diverse accumulation of experimental restrictions, which unavoidably result in fundamental reconstruction artifacts. These restrictions refer to: partial opacity, a limited view (limited angle or missing wedge), very few angles (with respect to the detector size), limited to a region of interest (ROI; due to the sample size), variable angular increments as well as sample degradation due the interactions with the electron beam. An advanced version of the DIRECTT (Direct Iterative Reconstruction of Computed Tomography Trajectories) algorithm proves to cope with most of these severe deviations from ideal CT measuring conditions. However, careful data preprocessing is required in order to exploit the capabilities of the algorithm. Nanometer sized Ruthenium catalyst particles for fuel cell applications are 3D imaged at a few Ångström resolution in order to estimate their partial free surface on carbon black supports, which rule the efficiency of the catalytic activity. Comparisons of DIRECTT reconstructions to the conventional filtered back projection, prove the significant improvements. PB - Deutsche Gesellscahft für Zerstörungsfreie Prüfung e.V. (DGZfP) T2 - DIR 2011 - International symposium on digital industrial raidology and computed tomography CY - Berlin, Germany DA - 20.06.2011 KW - Electron tomography KW - Computed tomography KW - Reconstruction algorithms PY - 2011 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/24357 AN - OPUS4-24357 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-243577 SN - 978-3-940283-34-4 IS - DGZfP-BB 128 (Tu.3.3) SP - 1 EP - 6 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany