TY - JOUR A1 - Schmid, Thomas A1 - Schäfer, N. A1 - Levcenko, S. A1 - Rissom, T. A1 - Abou-Ras, D. T1 - Orientation-distribution mapping of polycrystalline materials by Raman microspectroscopy T2 - Scientific reports N2 - Raman microspectroscopy provides the means to obtain local orientations on polycrystalline materials at the submicrometer level. The present work demonstrates how orientation-distribution maps composed of Raman intensity distributions can be acquired on large areas of several hundreds of square micrometers. A polycrystalline CuInSe2 thin film was used as a model system. The orientation distributions are evidenced by corresponding measurements using electron backscatter diffraction (EBSD) on the same identical specimen positions. The quantitative, local orientation information obtained by means of EBSD was used to calculate the theoretical Raman intensities for specific grain orientations, which agree well with the experimental values. The presented approach establishes new horizons for Raman microspectroscopy as a tool for quantitative, microstructural analysis at submicrometer resolution. PB - Nature Publishing Group CY - London PY - 2015 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/35224 AN - OPUS4-35224 SN - 2045-2322 VL - 5 SP - Article 18410, 1 EP - 7 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany