TY - GEN A1 - Lange, Axel T1 - Straightforward Correction of X-Ray Detector Backlighting T2 - 18th World Conference on Nondestructive Testing T2 - 18th World Conference on Nondestructive Testing CY - Durban, South Africa DA - 2012-04-16 PY - 2012 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/25800 AN - OPUS4-25800 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany