TY - CONF A1 - Pelkner, Matthias A1 - Reimund, Verena A1 - Erthner, Thomas A1 - Panke, Nicolai A1 - Kreutzbruck, Marc ED - Chimenti, D.E. ED - Bond, L.J. ED - Thompson, D.O. T1 - Automated inspection of surface breaking cracks using GMR sensor arrays T2 - 40th Annual review of progress in quantitative nondestructive evaluation (Proceedings) N2 - We present a prototype for automated magnetic stray field testing of ferromagnetic roller bearings. For this purpose NDE-adapted GMR sensor arrays (giant magneto resistance) are used for the detection of surface breaking cracks. The sensors are miniaturized down to the lower µm-regime to achieve adequate spatial resolution. In doing so, sensor arrays with up to 48 elements are used to inspect the bearing surface within a few seconds only. In contrast to magnetic particle inspection (MPI), where the global magnetization requires a further inspection step and succeeding demagnetization, the presented prototype only locally magnetize the surface area in the vicinity of the GMR Sensors. For the local magnetization, the applied sub-surface magnetic field was simulated and proofed for detecting flaws with a depth of a few 10 µm. By multiplexing the sensor array with an adapted read out electronics we quasi simultaneously detect the normal field component of about 100µm above the surface. The detection of artificial notches with a depth of 40 µm and more could be resolved with a SNR better than 20 dB. The presented testing facility is fast and provides a step towards automated testing of safety relevant steel components. T2 - 40th Annual review of progress in quantitative nondestructive evaluation CY - Baltimore, Maryland, USA DA - 2013-07-21 KW - GMR KW - Magnetic flux leakage KW - Sensor array KW - Non-destructive testing PY - 2014 SN - 978-0-7354-1212-5 SN - 978-0-7354-1211-8 DO - https://doi.org/10.1063/1.4864984 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings VL - 1581 33B SP - 1393 EP - 1399 PB - AIP Publishing AN - OPUS4-31280 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -