TY - JOUR A1 - Ewert, Uwe A1 - Zscherpel, Uwe A1 - Heyne, Klara A1 - Jechow, Mirko A1 - Bavendiek, K. T1 - Image quality in digital industrial radiography T2 - Materials evaluation PB - Society for Nondestructive Testing CY - Columbus, Ohio KW - ZfP KW - Radiographie KW - Bildqualität KW - Digitale Detektoren PY - 2012 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/26699 AN - OPUS4-26699 SN - 0025-5327 VL - 70 IS - 8 SP - 955 EP - 964 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany