TY - CONF A1 - Jakubowski, Norbert T1 - ICP-MS with Sector Field Devices N2 - This lecture is an introduction to ICP-MS with a double focusing magnetic sector mass analyzer. It offers fundamental background, a thorough discussion of analytical features, and state of the art information on applications. Different types of double focusing instruments also are considered. Specific topics include fundamental aspects of ICP-MS (physical properties of a double focusing instrument, operational characteristics in comparison with quadrupole instruments); analytical characteristics (spectral and non-spectral interferences, figures of merit in low and high resolution modes, blanks and memory effects, HPLC and GC interfaces), and applications (industrial including ultra-pure reagents and alloys, environmental, geological, and biomedical materials). T2 - Winter Conference on Plasma Spectrochemistry CY - Tucson, Arizona, USA DA - 10.01.2016 KW - High-resolution ICP-MS KW - Figures of merit KW - Interfaces KW - Applications KW - Ultra-trace analysis PY - 2016 AN - OPUS4-37148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -