TY - GEN A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - van Hemelrijck, D. T1 - X-ray refraction - new methods for non-destructive evaluation of advanced materials T2 - Emerging technologies in NDT T2 - 2nd International Conference on Emerging Technologies in NDT CY - Athens, Greece DA - 1999-05-24 KW - X-ray refraction PY - 2000 SN - 90-5809-127-9 SP - 207 EP - 212 PB - Balkema CY - Rotterdam AN - OPUS4-851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -