TY - CONF A1 - Goebbels, Jürgen T1 - Scalability of CT - measurements T2 - Symposium on Computed Tomography applied to Dimensional Control, BAM T2 - Symposium on Computed Tomography applied to Dimensional Control, BAM CY - Berlin, Germany DA - 2009-10-06 PY - 2009 AN - OPUS4-19761 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -