TY - JOUR A1 - Bartscher, M. A1 - Hilpert, U. A1 - Goebbels, Jürgen A1 - Weidemann, Gerd T1 - Enhancement and Proof of Accuracy of Industrial Computed Tomography (CT) Measurements JF - CIRP Annals : Manufacturing technology KW - Coordinate Measuring Machine (CMM) KW - X-ray KW - Uncertainty PY - 2007 SN - 0007-8506 SN - 1726-0604 VL - 56 IS - 1 SP - 495 EP - 498 PB - Elsevier CY - Oxford AN - OPUS4-15738 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -